This service offers electron microscopy measurements using a Transmission Electron Microscope (TEM) and a Scanning Electron Microscope (SEM),
as well as support with the relevant sample preparations. |
Electron Microscopy is used to study samples at the micrometer and nanometer scale in order to |
| - achieve images for studying sizes and shapes of the structures in a sample |
| - achieve element maps for studying material composition arrangements
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With TEM it is possible to look inside a sample(thickness < 100 nm) |
With SEM it is possible to exclusively study its surface(penetration depth < 10 nm) |